DocumentCode :
665919
Title :
Reliability analysis of an LCL tuned track segmented bi-directional inductive power transfer system
Author :
Iqbal, S. M. Asif ; Madawala, Udaya K. ; Thrimawithana, Duleepa J. ; Swain, Akshya ; Blaabjerg, Frede
Author_Institution :
Dept. of Electr. & Comput. Eng., Univ. of Auckland, Auckland, New Zealand
fYear :
2013
fDate :
10-13 Nov. 2013
Firstpage :
1217
Lastpage :
1222
Abstract :
Bi-directional Inductive Power Transfer (BDIPT) technique is suitable for renewable energy based applications such as electric vehicles (EVs), for the implementation of vehicle-to-grid (V2G) systems. Recently, more efforts have been made by researchers to improve both efficiency and reliability of renewable energy systems to further enhance their economical sustainability. This paper presents a comparative reliability study between a typical BDIPT system and an individually controlled segmented BDIPT system. Steady state thermal simulation results are provided for different output power levels for a 1.5 kW BDIPT system in a MATLAB/Simulink environment. Reliability parameters such as failure rate and mean time between failures (MTBF) are compared between the two systems. A nonlinear programming (NP) model is developed for optimizing charging schedule for a stationery EV. A case study of EV optimum charging is provided for a 24 hours period indicating minimum cost and higher reliability.
Keywords :
electric vehicles; inductive power transmission; nonlinear programming; power grids; reliability; renewable energy sources; BDIPT system; EV optimum charging; LCL tuned track segmented bidirectional inductive power transfer system; MTBF; NP model; V2G system; electric vehicle; mean time between failure; nonlinear programming model; reliability analysis; renewable energy based application; steady state thermal simulation; vehicle-to-grid system; Batteries; Bidirectional control; Heat sinks; Mathematical model; Reliability; Schedules; System-on-chip; Bi-directional inductive power transfer; electric vehicle; optimization; reliability analysis; thermal simulation; track segmentation;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Industrial Electronics Society, IECON 2013 - 39th Annual Conference of the IEEE
Conference_Location :
Vienna
ISSN :
1553-572X
Type :
conf
DOI :
10.1109/IECON.2013.6699306
Filename :
6699306
Link To Document :
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