• DocumentCode
    665941
  • Title

    The electromagnetic relay test system based on TMS320F28335

  • Author

    Yuye Wang ; Fengling Han ; Wei Xiang ; Guangrui Xu

  • Author_Institution
    Coll. of Inf. & Commun. Eng., Harbin Eng. Univ., Harbin, China
  • fYear
    2013
  • fDate
    10-13 Nov. 2013
  • Firstpage
    1355
  • Lastpage
    1358
  • Abstract
    An electromagnetic relay test system is designed based on the 32-bit floating-point Microcontrollers (MCU): TMS320F28335. In the test system, the relay characteristic parameters, such as the coil resistance, pull-in voltage, release voltage and time parameters, can be tested by sampling of the relay coil current, electric shock voltage and drive supply voltage. The tested results can be displayed on the LCD and transmitted to PC. The sampling frequency of the system is 10 M Hertz, which is higher than the other relay test system. The whole system is portable and has low power consumption. Finally, the experimental results verify that the required parameters of the relay can be tested accurately using the designed system.
  • Keywords
    electric potential; microcontrollers; MCU; TMS320F28335; coil resistance; drive supply voltage; electric shock voltage; electromagnetic relay test system; floating point microcontrollers; pull-in voltage; relay coil current; sampling frequency; Coils; Educational institutions; Electromagnetics; Relays; Reliability; Resistance; Testing; TMS320F28335; coil resistance; relay characteristic parameters; release voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Industrial Electronics Society, IECON 2013 - 39th Annual Conference of the IEEE
  • Conference_Location
    Vienna
  • ISSN
    1553-572X
  • Type

    conf

  • DOI
    10.1109/IECON.2013.6699329
  • Filename
    6699329