DocumentCode :
666114
Title :
Development of an advanced software for a single aperture Defocusing Micro Particle Tracking Velocimetry application
Author :
Ratzenbock, Christian ; Emhofer, Johann ; Maszl, Christian ; Fleckl, Thomas
Author_Institution :
Energy Dept., AIT - Austrian Inst. of Technol., Vienna, Austria
fYear :
2013
fDate :
10-13 Nov. 2013
Firstpage :
2401
Lastpage :
2407
Abstract :
The research and development of novel fluids for high-efficient absorption heat pump applications require a detailed analysis of microscopic liquid flows. For this purpose, a Defocusing Micro Particle Tracking Velocimetry approach has been successfully implemented using an existing PIV-setup. Due to the lack of commercial software for our application, an image processing software was developed in order to evaluate fluid flows from the recorded images. We show that the use of a modified Circular Hough Transform for particle detection, as well as a matching algorithm using normalized radial brightness distributions of the particles instead of conventional cross-correlation, result in a significantly higher performance and a shorter computation time.
Keywords :
Hough transforms; absorption; brightness; computational fluid dynamics; flow visualisation; heat pumps; image capture; image matching; microfluidics; physics computing; PIV-setup; advanced software development; fluid flow evaluation; high-efficient absorption heat pump applications; image processing software; image recording; microscopic liquid flow analysis; modified circular Hough transform; normalized radial brightness distributions; particle detection; research and development; single aperture defocusing microparticle tracking velocimetry application; Apertures; Image edge detection; Particle tracking; Shape; Software; Vectors; Correlation; Cost function; Fluid dynamics; Image edge detection; Object detection; Pattern matching; Velocity measurement;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Industrial Electronics Society, IECON 2013 - 39th Annual Conference of the IEEE
Conference_Location :
Vienna
ISSN :
1553-572X
Type :
conf
DOI :
10.1109/IECON.2013.6699507
Filename :
6699507
Link To Document :
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