• DocumentCode
    66614
  • Title

    Multicell Fault Current Limiter

  • Author

    Wenyong Guo ; Liye Xiao ; Shaotao Dai ; Zhifeng Zhang ; Tao Ma ; Yuanhe Li ; Xi Xu

  • Author_Institution
    Inst. of Electr. Eng., Beijing, China
  • Volume
    61
  • Issue
    4
  • fYear
    2014
  • fDate
    Apr-14
  • Firstpage
    2071
  • Lastpage
    2080
  • Abstract
    A multicell fault current limiter (MCFCL) is proposed in this paper. The MCFCL is composed of multiple fault current limiting cells. Each fault current limiting cell consists of a fault current limiting inductor and a power electronic module. The proposed MCFCL has the flexibility in expanding the operation voltage by increasing the number of fault current limiting cells. The MCFCL has excellent static and dynamic voltage equalizing capability between different cells, which makes it highly reliable. The MCFCL utilizes the fault energy absorption bypasses instead of varistors to prevent overvoltages across the semiconductor devices, which makes it able to repeat fault current limitation multiple times in a short time interval. Moreover, the MCFCL has rather high efficiency, which is expected to be no less than 99.9% with appropriate semiconductor devices. The operational principles and parameter design methods of the MCFCL are presented. A medium-voltage prototype is developed and tested. The simulation and experimental results are presented to clarify the theory and feasibility of the proposed approaches.
  • Keywords
    fault current limiters; overvoltage protection; varistors; MCFCL; dynamic voltage equalizing capability; fault current limiting inductor; fault energy absorption; multicell fault current limiter; multiple fault current limiting cell; overvoltage prevention; parameter design method; power electronic module; semiconductor device; static voltage equalizing capability; varistor; Fault current; fault current limiter (FCL); semiconductor switch;
  • fLanguage
    English
  • Journal_Title
    Industrial Electronics, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0278-0046
  • Type

    jour

  • DOI
    10.1109/TIE.2013.2263773
  • Filename
    6517249