DocumentCode :
6663
Title :
An Explicit Surface Potential Calculation and Compact Current Model for AlGaN/GaN HEMTs
Author :
Wanling Deng ; Junkai Huang ; Xiaoyu Ma ; Liou, Juin J.
Author_Institution :
Dept. of Electron. Eng., Jinan Univ., Guangzhou, China
Volume :
36
Issue :
2
fYear :
2015
fDate :
Feb. 2015
Firstpage :
108
Lastpage :
110
Abstract :
In this letter, a new compact model for the AlGaN/GaN high-electron mobility transistors developed based on explicit solutions to the Fermi level and the surface potential is presented. Its simple calculation and high accuracy in predicting the surface potential and current-voltage characteristics make the model ideal for circuit simulation applications. This surface-potential-based compact model accounts for the self-heating effect by considering the temperature-dependent free-carrier mobility. The model is verified against numerical results and measured data under a wide range of bias conditions.
Keywords :
Fermi level; III-V semiconductors; aluminium compounds; gallium compounds; high electron mobility transistors; numerical analysis; semiconductor device models; surface potential; wide band gap semiconductors; AlGaN-GaN; Fermi level; HEMT; circuit simulation application; compact current model; current-voltage characteristics; explicit surface potential calculation; high-electron mobility transistor; numerical analysis; self-heating effect; temperature-dependent free-carrier mobility; Aluminum gallium nitride; Analytical models; Gallium nitride; HEMTs; MODFETs; Mathematical model; Numerical models; AlGaN/GaN high-electron mobility transistor (HEMT); compact model; drain current; self-heating effect;
fLanguage :
English
Journal_Title :
Electron Device Letters, IEEE
Publisher :
ieee
ISSN :
0741-3106
Type :
jour
DOI :
10.1109/LED.2015.2388706
Filename :
7004033
Link To Document :
بازگشت