• DocumentCode
    667021
  • Title

    Imaging the transmission of light through a crystalline silicon wafer with a silicon detector array

  • Author

    Schlosser, Viktor

  • Author_Institution
    Fac. of Phys., Univ. of Vienna, Vienna, Austria
  • fYear
    2013
  • fDate
    10-13 Nov. 2013
  • Firstpage
    8085
  • Lastpage
    8089
  • Abstract
    A simple experimental set up for capturing the distribution of light transmitted through a silicon wafer is presented. As sensing element a silicon based charge coupled device, CCD of a 4 Megapixel camera was used. The responsitivity of the camera in the optical NIR wavelength range was evaluated. The applicability of a pulsed Xenon arc lamp built into a photographer´s flash light as light source was investigated. First results from transmission images proof the potential of these two components for further applications in the solar industry.
  • Keywords
    CCD image sensors; elemental semiconductors; image processing equipment; infrared spectra; light transmission; optical variables measurement; silicon; CCD camera; Si; Xenon arc lamp; charge coupled device; crystalline silicon wafer; light distribution; light transmission; optical NIR wavelength range; photographer flash light; silicon detector array; Cameras; Charge coupled devices; Light emitting diodes; Optical imaging; Optical sensors; Silicon; NIR transmission; imaging; silicon wafer;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Industrial Electronics Society, IECON 2013 - 39th Annual Conference of the IEEE
  • Conference_Location
    Vienna
  • ISSN
    1553-572X
  • Type

    conf

  • DOI
    10.1109/IECON.2013.6700485
  • Filename
    6700485