Title :
Imaging the transmission of light through a crystalline silicon wafer with a silicon detector array
Author :
Schlosser, Viktor
Author_Institution :
Fac. of Phys., Univ. of Vienna, Vienna, Austria
Abstract :
A simple experimental set up for capturing the distribution of light transmitted through a silicon wafer is presented. As sensing element a silicon based charge coupled device, CCD of a 4 Megapixel camera was used. The responsitivity of the camera in the optical NIR wavelength range was evaluated. The applicability of a pulsed Xenon arc lamp built into a photographer´s flash light as light source was investigated. First results from transmission images proof the potential of these two components for further applications in the solar industry.
Keywords :
CCD image sensors; elemental semiconductors; image processing equipment; infrared spectra; light transmission; optical variables measurement; silicon; CCD camera; Si; Xenon arc lamp; charge coupled device; crystalline silicon wafer; light distribution; light transmission; optical NIR wavelength range; photographer flash light; silicon detector array; Cameras; Charge coupled devices; Light emitting diodes; Optical imaging; Optical sensors; Silicon; NIR transmission; imaging; silicon wafer;
Conference_Titel :
Industrial Electronics Society, IECON 2013 - 39th Annual Conference of the IEEE
Conference_Location :
Vienna
DOI :
10.1109/IECON.2013.6700485