DocumentCode :
667070
Title :
Complex bifurcation and torus breakdown in higher order converters with an inductive impedance load
Author :
Fan Xie ; Bo Zhang ; Dongyuan Qiu ; Ru Yang ; IU, Herbert Ho-Ching
Author_Institution :
Sch. of Electr. Power, South China Univ. of Technol., Guangzhou, China
fYear :
2013
fDate :
10-13 Nov. 2013
Firstpage :
8362
Lastpage :
8366
Abstract :
Power switching converters have exhibited a wide range of nonlinear behaviors, such as bifurcation and chaos. In this paper, complex bifurcation behaviors in higher order converters with an inductive impedance load are analyzed by studying the Floquet multipliers and the switching modes of the system. A single inner current loop controlled Čuk converter is used as an example to account. The period-1 orbit loses its stability by period-doubling and subcritical Neimark-Sacker bifurcations. We find that border collision behavior occurs between period-2 orbits. And then the period-2 orbit enters an unstable torus orbit via Neimark-Sacker bifurcation. The dynamical behaviors of the system are clearly studied under certain conditions. The mechanism of the coexisting phenomenon from subcritical Neimark-Sacker bifurcation is explained. Finally, the chaotic phenomenon from torus breakdown is firstly detected in this higher order switching converter with an inductive impedance load, its characteristics about phase shift to different initial conditions are investigated as well.
Keywords :
bifurcation; circuit stability; electric breakdown; multiplying circuits; switching convertors; Floquet multiplier; border collision behavior; chaotic phenomenon; complex bifurcation behavior; higher order converter; inductive impedance load; period-1 orbit; period-2 orbit; period-doubling stability; power switching converter; single inner current loop controlled Cuk converter; subcritical Neimark-Sacker bifurcation; torus breakdown; Bifurcation; Chaos; Eigenvalues and eigenfunctions; Electric breakdown; Impedance; Orbits; Switches; Čuk converter; bifurcation; chaotic state; coexisting phenomenon; inductive impedance load; torus breakdown;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Industrial Electronics Society, IECON 2013 - 39th Annual Conference of the IEEE
Conference_Location :
Vienna
ISSN :
1553-572X
Type :
conf
DOI :
10.1109/IECON.2013.6700534
Filename :
6700534
Link To Document :
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