DocumentCode :
667764
Title :
Sub-10 fs jitter S-band oscillators and VCOs in a 1×1×0.23 mm3 chip scale package
Author :
Gilbert, Stephen ; Zhang, Fang ; Parker, Reed ; Small, Martha ; Bi, Frank ; Callaghan, Lori ; Ortiz, S. ; Ruby, Rich
Author_Institution :
Avago Technol., San Jose, CA, USA
fYear :
2013
fDate :
21-25 July 2013
Firstpage :
171
Lastpage :
174
Abstract :
We present a fourth-design generation Free Running Oscillator and Voltage Controlled Oscillator using integrated bipolar circuitry in the lid wafer with a temperature-compensated FBAR resonator in the base wafer. The goal is to produce a high frequency, low-noise oscillator. Because there are ~15,000 oscillators per wafer, we can develop very sensitive testing procedures to study the oscillator behavior. For example, we have determined our frequency measurement accuracy and precision to be ~ 0.2 parts-per-million (1 σ), and our phase sensitivity floor to be less than -180 dBc/Hz. Measurements on package hermeticity, suggest that the oscillators behave with the same level of integrity as our standard FBAR filters.
Keywords :
MMIC oscillators; bipolar MMIC; chip scale packaging; frequency measurement; jitter; voltage-controlled oscillators; S-band oscillators; VCOs; base wafer; chip scale package; fourth-design generation free running oscillator; frequency measurement accuracy; frequency measurement precision; high frequency oscillator; integrated bipolar circuitry; lid wafer; low-noise oscillator; package hermeticity; phase sensitivity floor; temperature-compensated FBAR resonator; voltage controlled oscillator; Film bulk acoustic resonators; Frequency measurement; Phase noise; Resonant frequency; Resonator filters; Temperature measurement;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
European Frequency and Time Forum & International Frequency Control Symposium (EFTF/IFC), 2013 Joint
Conference_Location :
Prague
Type :
conf
DOI :
10.1109/EFTF-IFC.2013.6702123
Filename :
6702123
Link To Document :
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