DocumentCode
667861
Title
Characterization of Parylene-C using quartz thickness shear mode (TSM) resonators
Author
Huiyan Wu ; Hongfei Zu ; Xiaotian Li ; Qing-Ming Wang
Author_Institution
Dept. of Mech. Eng. & Mater. Sci., Univ. of Pittsburgh, Pittsburgh, PA, USA
fYear
2013
fDate
21-25 July 2013
Firstpage
787
Lastpage
790
Abstract
Due to its high sensitivity, repeatability and easy connection with electrical measurement systems, Quartz thickness-shear-mode (TSM) resonator is adopted to extract the complex shear modulus of Parylene-C films, which play an important role as both an effective wave-guiding layer and biocompatible interfacial layer in Shear-Horizontal Surface Acoustic Wave Device (SH-SAW, Love Mode). Parylene-C films of different thicknesses were deposited on the surface of AT-cut quartz TSM resonators, and admittance spectrums of these uncoated and coated TSM were measured by an impedance analyzer. Results indicated that the ideal thickness range for extraction was from 2.04 μm to 3.55 μm, effectively avoiding inadequate acoustic deformation as well as excessive electrical-response attenuation. The storage modulus G\´ and loss modulus G" of Parylene-C were 0.155±0.011 GPa and 4.78±0.44 GPa, respectively.
Keywords
crystal resonators; organic compounds; shear modulus; surface acoustic wave devices; thin films; Parylene-C; acoustic deformation; admittance spectrums; electrical-response attenuation; impedance analyzer; loss modulus; quartz thickness shear mode resonators; shear modulus; shear-horizontal surface acoustic wave device; size 2.04 mum to 3.55 mum; storage modulus; Acoustic waves; Films; Fitting; Surface acoustic wave devices; Surface impedance; Surface treatment; Parylene-C; SH-SAW; TLM; TSM; shear modulus;
fLanguage
English
Publisher
ieee
Conference_Titel
European Frequency and Time Forum & International Frequency Control Symposium (EFTF/IFC), 2013 Joint
Conference_Location
Prague
Type
conf
DOI
10.1109/EFTF-IFC.2013.6702223
Filename
6702223
Link To Document