DocumentCode
667903
Title
Reduction of anchor losses by etched slots in aluminum nitride contour mode resonators
Author
Cassella, Cristian ; Segovia-Fernandez, Jeronimo ; Piazza, Gianluca ; Cremonesi, Massimiliano ; Frangi, Alejandro
Author_Institution
Electr. & Comput. Eng, Carnegie Mellon Univ., Pittsburgh, PA, USA
fYear
2013
fDate
21-25 July 2013
Firstpage
926
Lastpage
929
Abstract
This paper presents a new technique to increase the quality factor, Q, of AlN Contour Mode Resonators (CMRs). The technique uses etched slots in the body of AlN CMRs to reduce energy dissipation through the anchors. The reduction of the energy lost through the supporting anchors improves the device Q without altering its electromechanical coupling, kt2. An almost 50% improvement in the Figure of Merit, FoM, defined as the product between Q and kt2, has been measured in 220 MHz AlN CMRs.
Keywords
III-V semiconductors; VHF circuits; electromechanical effects; etching; losses; resonators; wide band gap semiconductors; AlN; CMR; FoM; aluminum nitride contour mode resonator; anchor loss reduction; electromechanical coupling; energy dissipation reduction; energy lost reduction; figure of merit; frequency 220 MHz; quality factor; slot etching; Acoustics; Films; III-V semiconductor materials; Metals; Q-factor; Resonant frequency; Vibrations;
fLanguage
English
Publisher
ieee
Conference_Titel
European Frequency and Time Forum & International Frequency Control Symposium (EFTF/IFC), 2013 Joint
Conference_Location
Prague
Type
conf
DOI
10.1109/EFTF-IFC.2013.6702267
Filename
6702267
Link To Document