• DocumentCode
    667903
  • Title

    Reduction of anchor losses by etched slots in aluminum nitride contour mode resonators

  • Author

    Cassella, Cristian ; Segovia-Fernandez, Jeronimo ; Piazza, Gianluca ; Cremonesi, Massimiliano ; Frangi, Alejandro

  • Author_Institution
    Electr. & Comput. Eng, Carnegie Mellon Univ., Pittsburgh, PA, USA
  • fYear
    2013
  • fDate
    21-25 July 2013
  • Firstpage
    926
  • Lastpage
    929
  • Abstract
    This paper presents a new technique to increase the quality factor, Q, of AlN Contour Mode Resonators (CMRs). The technique uses etched slots in the body of AlN CMRs to reduce energy dissipation through the anchors. The reduction of the energy lost through the supporting anchors improves the device Q without altering its electromechanical coupling, kt2. An almost 50% improvement in the Figure of Merit, FoM, defined as the product between Q and kt2, has been measured in 220 MHz AlN CMRs.
  • Keywords
    III-V semiconductors; VHF circuits; electromechanical effects; etching; losses; resonators; wide band gap semiconductors; AlN; CMR; FoM; aluminum nitride contour mode resonator; anchor loss reduction; electromechanical coupling; energy dissipation reduction; energy lost reduction; figure of merit; frequency 220 MHz; quality factor; slot etching; Acoustics; Films; III-V semiconductor materials; Metals; Q-factor; Resonant frequency; Vibrations;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    European Frequency and Time Forum & International Frequency Control Symposium (EFTF/IFC), 2013 Joint
  • Conference_Location
    Prague
  • Type

    conf

  • DOI
    10.1109/EFTF-IFC.2013.6702267
  • Filename
    6702267