Experimental characterization of optoelectronic oscillators based on optical mini-resonators

Author

Henriet, Remi ; Coillet, Aurelien ; Salzenstein, Patrice ; Saleh, Khaldoun ; Larger, L. ; Chembo, Yanne K.

Author_Institution

Franche Comte Electron. Mec. Opt., Thermique Sci. et Technol. (FEMTO-ST), Besancon, France

fYear

2013

fDate

21-25 July 2013

Firstpage

37

Lastpage

39

Abstract

The fabrication process of whispering gallery mode disk resonators is presented with different characterization techniques in order to monitor roughness and optical quality factor. This type of resonators is then used as the reference frequency element to stabilize the oscillation frequency of an optoelectronic oscillator. Experimental results are provided and demonstrate the efficiency of the method.

Keywords

Q-factor; optical fabrication; optical resonators; oscillators; whispering gallery modes; fabrication process; optical mini-resonators; optical quality factor; optoelectronic oscillators; oscillation frequency; whispering gallery mode disk resonators; Microwave amplifiers; Microwave filters; Optical amplifiers; Optical fibers; Optical resonators; Oscillators; Optoelectronic oscillator; delay line; optical resonator; phase noise;

fLanguage

English

Publisher

ieee

Conference_Titel

European Frequency and Time Forum & International Frequency Control Symposium (EFTF/IFC), 2013 Joint

Conference_Location

Prague

Type

conf

DOI

10.1109/EFTF-IFC.2013.6702286

Filename

6702286