DocumentCode :
667922
Title :
Experimental characterization of optoelectronic oscillators based on optical mini-resonators
Author :
Henriet, Remi ; Coillet, Aurelien ; Salzenstein, Patrice ; Saleh, Khaldoun ; Larger, L. ; Chembo, Yanne K.
Author_Institution :
Franche Comte Electron. Mec. Opt., Thermique Sci. et Technol. (FEMTO-ST), Besancon, France
fYear :
2013
fDate :
21-25 July 2013
Firstpage :
37
Lastpage :
39
Abstract :
The fabrication process of whispering gallery mode disk resonators is presented with different characterization techniques in order to monitor roughness and optical quality factor. This type of resonators is then used as the reference frequency element to stabilize the oscillation frequency of an optoelectronic oscillator. Experimental results are provided and demonstrate the efficiency of the method.
Keywords :
Q-factor; optical fabrication; optical resonators; oscillators; whispering gallery modes; fabrication process; optical mini-resonators; optical quality factor; optoelectronic oscillators; oscillation frequency; whispering gallery mode disk resonators; Microwave amplifiers; Microwave filters; Optical amplifiers; Optical fibers; Optical resonators; Oscillators; Optoelectronic oscillator; delay line; optical resonator; phase noise;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
European Frequency and Time Forum & International Frequency Control Symposium (EFTF/IFC), 2013 Joint
Conference_Location :
Prague
Type :
conf
DOI :
10.1109/EFTF-IFC.2013.6702286
Filename :
6702286
Link To Document :
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