DocumentCode :
667961
Title :
High-speed and low-power 2.5D I/O circuits for memory-logic-integration by through-silicon interposer
Author :
Jiacheng Wang ; Shunli Ma ; Manoj, P. D. Sai ; Mingbin Yu ; Weerasekera, Roshan ; Hao Yu
Author_Institution :
Interdiscipl. Grad. Sch., Nanyang Technol. Univ., Singapore, Singapore
fYear :
2013
fDate :
2-4 Oct. 2013
Firstpage :
1
Lastpage :
4
Abstract :
In this paper, two high-speed and low-power I/O circuits are developed using through-silicon-interposer (TSI) for 2.5D integration of multi-core processor and memory in 65 nm CMOS process. For a 3 mm TSI interconnection of transmission line (T-line), the first I/O circuit is a low-voltage-differential-signal (LVDS) buffer and the second one is a current-mode-logic (CML) buffer. To compensate the high-frequency loss from T-line, a pre-emphasis circuit is deployed in the LVDS buffer, and a wide-band inductor-matching is deployed in the CML buffer. Based on the post layout simulation results, the LVDS buffer can achieve 360 mV peak-to-peak differential output signal swing and 563 fs cycle-to-cycle jitter with 10 Gb/s bandwidth and 4.8 mW power consumption. The CML buffer can achieve 240 mV peak-to-peak differential output signal swing and 453 fs jitter with 12.8 Gb/s data-rate and 1.6 mA current consumption under 0.6 V ultra low-power supply.
Keywords :
CMOS logic circuits; CMOS memory circuits; buffer circuits; high-speed integrated circuits; integrated circuit interconnections; integrated memory circuits; logic circuits; logic design; low-power electronics; microprocessor chips; three-dimensional integrated circuits; 2.5D I/O circuits; CMOS process; bit rate 10 Gbit/s; bit rate 12.8 Gbit/s; current 1.6 mA; current-mode-logic buffer; high-speed I/O circuits; low-power I/O circuits; low-voltage-differential-signal buffer; memory-logic-integration; multicore processor; power 4.8 mW; power consumption; size 3 mm; size 65 nm; through-silicon interposer; through-silicon-interposer; time 453 fs; time 563 fs; transmission line; voltage 240 mV; voltage 360 mV; wide-band inductor-matching; IP networks; Inductors; Integrated circuit interconnections; Layout; Resistors; Simulation; Three-dimensional displays;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
3D Systems Integration Conference (3DIC), 2013 IEEE International
Conference_Location :
San Francisco, CA
Type :
conf
DOI :
10.1109/3DIC.2013.6702326
Filename :
6702326
Link To Document :
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