DocumentCode :
668024
Title :
Within-tier cooling and thermal isolation technologies for heterogeneous 3D ICs
Author :
Yue Zhang ; Hanju Oh ; Bakir, Muhannad S.
Author_Institution :
Sch. of Electr. & Comput. Eng., Georgia Inst. of Technol., Atlanta, GA, USA
fYear :
2013
fDate :
2-4 Oct. 2013
Firstpage :
1
Lastpage :
6
Abstract :
Thermal management in 3D ICs not only requires cooling, but may also require thermal isolation in scenarios in which high-power chips (e.g. logic chips) are stacked along with low-power and temperature-sensitive tiers (e.g. memory or silicon nanophotonic chips). A hybrid thermal solution combining within-tier microfluidic cooling for the high-power tier and within-tier thermal isolation for the low-power tier is proposed for the first time. In this paper, we report 1) within-tier microfluidic cooling in a processor-on-processor stack 2) TSVs with 23:1 aspect ratio integrated in the microfluidic heat sink, and 3) the integration of air/vacuum cavity in the low-power tier to `protect´ it from the temperature variation and nonuniformity of the high-power chip. Thermal modeling shows that the low-power tier temperature only increases by 4 °C when the power density of the processor tier increases from 50 W/cm2 to 100 W/cm2, compared to 22 °C temperature increase without thermal isolation.
Keywords :
cooling; heat sinks; integrated circuit modelling; isolation technology; low-power electronics; microfluidics; thermal management (packaging); three-dimensional integrated circuits; TSV; air/vacuum cavity; heterogeneous 3D IC; high-power chips; high-power tier; hybrid thermal solution; logic chips; low-power tiers; memory chips; microfluidic heat sink; power density; processor-on-processor stack; silicon nanophotonic chips; temperature variation; temperature-sensitive tiers; thermal isolation technologies; thermal management; thermal modeling; within-tier microfluidic cooling; within-tier thermal isolation; Cavity resonators; Heat sinks; Junctions; Microfluidics; Silicon; Three-dimensional displays; 3D ICs; air/vacuum cavity; high aspect ratio through-silicon via (TSV); thermal isolation; thermal management;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
3D Systems Integration Conference (3DIC), 2013 IEEE International
Conference_Location :
San Francisco, CA
Type :
conf
DOI :
10.1109/3DIC.2013.6702398
Filename :
6702398
Link To Document :
بازگشت