DocumentCode :
668722
Title :
An complementarity based feature selection method for pattern recognition
Author :
Xinghua Wu ; Yacan Sun
Author_Institution :
Sch. of Electr. & Electron. Eng., Shandong Univ. of Technol., Zibo, China
fYear :
2013
fDate :
20-22 Nov. 2013
Firstpage :
93
Lastpage :
96
Abstract :
For the pattern recognition problem, this paper proposes a feature selection method based on complementarity analysis. Analyse the separability of single feature, search the feature combination with the smallest probability of mixing region and in the mixed region with the greatest separability to reduce the probability of classification error. Compared with other feature selection algorithms, data testing result shows that the feature selection method based on complementarity analysis has a lower error recognition rate than other methods, which has verified the superiority and the advanced nature of the method.
Keywords :
complementarity; feature selection; classification error probability; complementarity analysis; data testing; error recognition rate; feature selection algorithms; pattern recognition; separability analysis; Algorithm design and analysis; Classification algorithms; Neural networks; Pattern recognition; Probability distribution; Remote sensing; Simulated annealing; complementarity analyze; feature selection; pattern recognition;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Consumer Electronics, Communications and Networks (CECNet), 2013 3rd International Conference on
Conference_Location :
Xianning
Print_ISBN :
978-1-4799-2859-0
Type :
conf
DOI :
10.1109/CECNet.2013.6703280
Filename :
6703280
Link To Document :
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