Title :
SoC power integrity from early estimation to design signoff
Author :
Yang, Melinda Ling ; Gundurao, Anil ; You, Eileen ; Gill, Harjot
Author_Institution :
SoC Bay Area R&D, Samsung Semicond. Inc., Milpitas, CA, USA
Abstract :
Summary form only given. Power integrity has become a major integration challenge even for low power ARM-based SoC design. As performance requirements demand higher speed, more advanced process nodes reduce transistor level voltage margin, and low power consumption dictate aggressive power saving schemes such as more frequent power mode shifts and power gating, it´s challenging to satisfy the power integrity requirements. Following descriptions are some important aspects for SoC chip design.
Keywords :
integrated circuit design; low-power electronics; system-on-chip; SoC power integrity; low power ARM-based SoC design; power gating; power mode shifts; power saving; process nodes; system-on-chip; transistor level voltage margin; Estimation; Logic gates; Noise; Power demand; System-on-chip; Transistors;
Conference_Titel :
Electrical Performance of Electronic Packaging and Systems (EPEPS), 2013 IEEE 22nd Conference on
Conference_Location :
San Jose, CA
Print_ISBN :
978-1-4799-0705-2
DOI :
10.1109/EPEPS.2013.6703454