DocumentCode :
668903
Title :
New simulation procedure for accurate package modeling considering chip-package interaction
Author :
Seler, Ernst ; Wojnowski, M. ; Weigel, Robert ; Hagelauer, A.
Author_Institution :
Univ. of Erlangen-Nuremberg, Erlangen, Germany
fYear :
2013
fDate :
27-30 Oct. 2013
Firstpage :
43
Lastpage :
46
Abstract :
This paper presents a novel simulation procedure for full-wave electromagnetic simulations for generating package models taking into account chip-package interaction. If a simulated structure is split into two sub simulations, the accuracy of the overall simulation decreases. This is mainly the case if no clean separation of a composition into sub simulations is possible due to interactions between the sub domains. We show by means of a simple example of an embedded Wafer Level Ball grid array (eWLB) package that the simulation results of a cascade of an eWLB package and a chip are different to the simulation of the complete composition. The proposed simulation procedure delivers a package model with the package-chip interactions included and therefore cascading with integrated circuit model is possible with a higher accuracy. We show that the simulation results of a cascade of a package model obtained with the new procedure and a chip are virtually equal to a simulation of the whole composition. Furthermore we show that the created model of the package obtained from the proposed procedure is independent of the electrical circuit on the chip. This proves that the separation of the package from the chip with the proposed procedure is valid.
Keywords :
ball grid arrays; chip scale packaging; integrated circuit modelling; wafer level packaging; chip-package interaction; circuit model; eWLB package; electrical circuit; full-wave electromagnetic simulations; package modeling; package-chip interactions; wafer level ball grid array; Accuracy; Insertion loss; Integrated circuit modeling; Semiconductor device modeling; Simulation; Solid modeling; Three-dimensional displays; 3D EM simulation; eWLB; package modeling; simulation accuracy;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electrical Performance of Electronic Packaging and Systems (EPEPS), 2013 IEEE 22nd Conference on
Conference_Location :
San Jose, CA
Print_ISBN :
978-1-4799-0705-2
Type :
conf
DOI :
10.1109/EPEPS.2013.6703463
Filename :
6703463
Link To Document :
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