DocumentCode :
668909
Title :
Timing analysis for thermally robust clock distribution network design for 3D ICs
Author :
Sung Joo Park ; Natu, Nitish ; Swaminathan, Madhavan ; Byunghyun Lee ; Sang Min Lee ; Woong Hwan Ryu ; Kee Sup Kim
Author_Institution :
Interconnect & Packaging Center, Georgia Inst. of Technol., Atlanta, GA, USA
fYear :
2013
fDate :
27-30 Oct. 2013
Firstpage :
69
Lastpage :
70
Abstract :
Three-dimensional Integrated Circuits provide a solution to overcome bottlenecks in performance and power management issues. However, the drawback arises in the form of increased thermal density that results in thermal gradients that affect signal integrity. Since, the clock signal is critical for ensuring the performance of synchronous digital systems, its design is very important. In this paper we analyze the effect of thermal gradient on the clock distribution networks in the context of 3D ICs. We also propose novel methods for compensating the thermal effects which have been validated through extensive simulations and preliminary hardware measurements.
Keywords :
clock distribution networks; three-dimensional integrated circuits; timing circuits; 3D IC; distribution network; power management; signal integrity; synchronous digital systems; thermal density; thermal effects; thermal gradients; three-dimensional integrated circuits; timing analysis; Clocks; Delays; Integrated circuit modeling; Temperature measurement; Temperature sensors; Three-dimensional displays; Through-silicon vias; 3D IC; CDN (Clock Distribution Network); Propagation Delay; TSV (Throung Silicon Via); Temperature gradient;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electrical Performance of Electronic Packaging and Systems (EPEPS), 2013 IEEE 22nd Conference on
Conference_Location :
San Jose, CA
Print_ISBN :
978-1-4799-0705-2
Type :
conf
DOI :
10.1109/EPEPS.2013.6703469
Filename :
6703469
Link To Document :
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