• DocumentCode
    668933
  • Title

    A package-level implementation of traveling-wave switch using PIN-diodes

  • Author

    Kaleem, S. ; Rentsch, S. ; Humbla, S. ; Hein, Matthias

  • Author_Institution
    RF & Microwave Res. Lab., Ilmenau Univ. of Technol., Ilmenau, Germany
  • fYear
    2013
  • fDate
    27-30 Oct. 2013
  • Firstpage
    179
  • Lastpage
    182
  • Abstract
    A single-pole single-throw switch constituting the transparent path in a reconfigurable switch matrix is presented, improving the availability of the switch matrix in case of an on-board power-fail. The design of the switch is based on the traveling-wave concept using packaged PIN-diodes on a thick-film ceramic substrate under the constraints on the number of PIN-diodes and power dissipation. The circuit design and analysis of the switch based on the concept of an artificial transmissionline are described. Unlike the traditional low-pass characteristics inherent to traveling-wave switches, high isolation is achieved by transforming the parasites of the PIN-diodes in the shunt arms to reveal band-pass characteristics besides assisting the assembly of the package. On-wafer measurements reveal an isolation ≥ 45 dB and an insertion loss ≤ 6 dB in the Ka-band downlink frequencies (17...22 GHz).
  • Keywords
    microwave switches; network analysis; network synthesis; p-i-n diodes; Ka-band downlink frequencies; PIN-diodes; artificial transmission line; circuit analysis; circuit design; frequency 17 GHz to 22 GHz; insertion loss; on-board power-fail; on-wafer measurements; package-level implementation; power dissipation; reconfigurable switch matrix; single-pole single-throw switch; thick-film ceramic substrate; traveling-wave switches; Impedance; Insertion loss; Power transmission lines; Substrates; Switches; Switching circuits; Transmission line measurements; Reconfigurable switch matrix; low temperature co-fired ceramic (LTCC); traveling-wave switch;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electrical Performance of Electronic Packaging and Systems (EPEPS), 2013 IEEE 22nd Conference on
  • Conference_Location
    San Jose, CA
  • Print_ISBN
    978-1-4799-0705-2
  • Type

    conf

  • DOI
    10.1109/EPEPS.2013.6703493
  • Filename
    6703493