Title :
On-line real-time temperature and power estimation of an IC using time-domain thermal filters
Author :
Jaeha Kung ; Minki Cho ; Yalamanchili, Sudhakar ; Mukhopadhyay, Saibal
Author_Institution :
Sch. of ECE, Georgia Inst. of Technol., Atlanta, GA, USA
Abstract :
A methodology is presented for on-line and realtime estimation of transient variations in temperature and average power of a chip after fabrication and packaging. Measurements from a 130nm CMOS test chip demonstrate the accuracy of the proposed approach.
Keywords :
CMOS integrated circuits; filters; integrated circuit packaging; integrated circuit testing; time-domain analysis; transient analysis; CMOS test chip; IC; on-line real-time temperature estimation; power estimation; size 130 nm; time-domain thermal filters; transient variations; Frequency measurement; Integrated circuit interconnections; Integrated circuit modeling; Layout; RLC circuits; Scattering parameters; Transmission line measurements;
Conference_Titel :
Electrical Performance of Electronic Packaging and Systems (EPEPS), 2013 IEEE 22nd Conference on
Conference_Location :
San Jose, CA
Print_ISBN :
978-1-4799-0705-2
DOI :
10.1109/EPEPS.2013.6703498
