DocumentCode :
669975
Title :
Modelling insight into the resonance frequencies of the microwave impedance parameters for GaAs HEMTs
Author :
Crupi, Giovanni ; Raffo, Antonio ; Schreurs, Dominique M. M.-P ; Avolio, Gustavo ; Caddemi, Alina ; Vannini, Giorgio
Author_Institution :
DICIEAMA, Univ. of Messina, Messina, Italy
Volume :
01
fYear :
2013
fDate :
16-19 Oct. 2013
Firstpage :
184
Lastpage :
187
Abstract :
The aim of this paper is to present a detailed and thorough investigation of the dips in the magnitude of the impedance parameters for AlGaAs/GaAs HEMTs. These dips should be attributed to the resonance between the extrinsic inductances and the intrinsic capacitances. As a consequence, the resonance frequencies associated to these dips can be analyzed to determine the intrinsic capacitances when the extrinsic inductances are known. To verify the validity of this straightforward approach, the extracted capacitances are compared with the results obtained with the conventional modelling method. The comparison is performed versus the gate-source voltage and the gate width.
Keywords :
III-V semiconductors; aluminium compounds; gallium arsenide; high electron mobility transistors; microwave transistors; semiconductor device models; AlGaAs-GaAs; HEMT; extrinsic inductances; gate width; gate-source voltage; intrinsic capacitances; microwave impedance parameters; resonance frequencies; Capacitance; Equivalent circuits; Gallium arsenide; HEMTs; Logic gates; MODFETs; Resonant frequency; HEMT; intrinsic capacitances; scattering parameter measurements; semiconductor device modelling;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Telecommunication in Modern Satellite, Cable and Broadcasting Services (TELSIKS), 2013 11th International Conference on
Conference_Location :
Nis
Print_ISBN :
978-1-4799-0899-8
Type :
conf
DOI :
10.1109/TELSKS.2013.6704916
Filename :
6704916
Link To Document :
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