DocumentCode :
67007
Title :
Forecast of CMOS Imagers Yield Learning by the Gompertz Model
Author :
Organtini, Paolo ; Russo, Felice
Author_Institution :
Micron Technol., Avezzano, Italy
Volume :
26
Issue :
3
fYear :
2013
fDate :
Aug. 2013
Firstpage :
393
Lastpage :
399
Abstract :
This paper presents a novel approach to modeling yield using the Gompertz function, which is widely used in biology to model the growth processes of plants, tumors, etc. We demonstrate that the yield-learning process in a semiconductor fab follows the same behavior of the growth of biological systems. We start with a simple time series model, which describes the learning process in terms of defect density reduction. Then we obtain the Gompertz growth model, which also fits the experimental data better than more traditional learning models such as the Gruber´ s general yield learning model [38] .
Keywords :
CMOS image sensors; integrated circuit manufacture; CMOS imagers yield learning; Gompertz function; Gompertz growth model; Gompertz model; biological systems growth; biology; defect density reduction; semiconductor fab; time series model; yield learning model; CMOS integrated circuits; forecasting; imaging; modelling; yield estimation;
fLanguage :
English
Journal_Title :
Semiconductor Manufacturing, IEEE Transactions on
Publisher :
ieee
ISSN :
0894-6507
Type :
jour
DOI :
10.1109/TSM.2013.2263887
Filename :
6517287
Link To Document :
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