• DocumentCode
    67007
  • Title

    Forecast of CMOS Imagers Yield Learning by the Gompertz Model

  • Author

    Organtini, Paolo ; Russo, Felice

  • Author_Institution
    Micron Technol., Avezzano, Italy
  • Volume
    26
  • Issue
    3
  • fYear
    2013
  • fDate
    Aug. 2013
  • Firstpage
    393
  • Lastpage
    399
  • Abstract
    This paper presents a novel approach to modeling yield using the Gompertz function, which is widely used in biology to model the growth processes of plants, tumors, etc. We demonstrate that the yield-learning process in a semiconductor fab follows the same behavior of the growth of biological systems. We start with a simple time series model, which describes the learning process in terms of defect density reduction. Then we obtain the Gompertz growth model, which also fits the experimental data better than more traditional learning models such as the Gruber´ s general yield learning model [38] .
  • Keywords
    CMOS image sensors; integrated circuit manufacture; CMOS imagers yield learning; Gompertz function; Gompertz growth model; Gompertz model; biological systems growth; biology; defect density reduction; semiconductor fab; time series model; yield learning model; CMOS integrated circuits; forecasting; imaging; modelling; yield estimation;
  • fLanguage
    English
  • Journal_Title
    Semiconductor Manufacturing, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0894-6507
  • Type

    jour

  • DOI
    10.1109/TSM.2013.2263887
  • Filename
    6517287