Title :
Sputtered titanium dioxide thin film for Extended-Gate FET sensor application
Author :
Rosdan, M.A. ; Herman, Sukreen Hana ; Abdullah, Wan Fazlida Hanim ; Kamarozaman, Nur Syahirah ; Syono, M.I.
Author_Institution :
Fac. of Electr. Eng., Univ. Teknol. Mara (UiTM), Shah Alam, Malaysia
Abstract :
This paper presents an investigation on sputtered titanium dioxide (TiO2) thin film for application in the Extended-Gate Field Effect Transistor (EGFET) sensor application for pH detection. The TiO2 thin film was fabricated on conductive indium-tin oxide (ITO) covered glass by using RF Sputtering method. An EGFET proof-of-concept setup was constructed using a commercial FET as the transducer and the TiO2/ITO structure was used for the extended gate. The sensor measurement was taken using semiconductor device parametric analyzer, constant-current constant-voltage biasing interfacing circuit and data logger to obtain the sensitivity and the characteristics for output voltage with respect to time. TiO2 thin film on ITO glass as the sensing membrane was compared with a bare ITO glass substrate for the extended gate. The TiO2/ITO glass exhibited the sensitivity of 42.1 mV/pH and good linearity of 0.9997 in the sensing range pH4, pH7 and pH10 which was better than the bare ITO glass sensitivity of 31.3 mV/pH and the linearity of 0.9868.
Keywords :
field effect transistors; semiconductor thin films; sensors; sputter deposition; titanium compounds; transducers; ITO glass substrate; RF sputtering method; SiO2; TiO2-ITO; conductive indium-tin oxide covered glass; constant-current constant-voltage biasing interfacing circuit; data logger; extended-gate FET sensor application; pH detection; semiconductor device parametric analyzer; sputtered titanium dioxide thin film; transducer; Biomembranes; Field effect transistors; Glass; Indium tin oxide; Logic gates; Sensitivity; Sensors;
Conference_Titel :
Micro and Nanoelectronics (RSM), 2013 IEEE Regional Symposium on
Conference_Location :
Langkawi
Print_ISBN :
978-1-4799-1181-3
DOI :
10.1109/RSM.2013.6706513