• DocumentCode
    671284
  • Title

    The evolution of organic solderability preservative (OSP) process in PCB application

  • Author

    Tong, K.H. ; Ku, M.T. ; Hsu, K.L. ; Tang, Qifu ; Chan, C.Y. ; Yee, K.W.

  • Author_Institution
    Dow Electron. Mater., Dow Chem. Co., Hong Kong, China
  • fYear
    2013
  • fDate
    22-25 Oct. 2013
  • Firstpage
    43
  • Lastpage
    46
  • Abstract
    The implementation of Restriction of Hazardous Substances Directive (RoHS) in 2006 has led to a requirement that soldering materials used in the fabrication of printed circuit boards (PCBs) should be lead-free. This change has raised the peak reflow temperature by 30 C as compared with a tin-lead process. A protective surface finishing should be designed to maintain good solderability, by preventing the copper surface from being oxidized, both during storage after PCB fabrication and during exposures to soldering temperatures. Organic solderability preservative (OSP) is considered as a preferred low cost surface mount technology (SMT)-compatible non-metallic surface finishing method, due to the excellent surface co-planarity of the coated pads. However, the protectiveness of some commercial available OSPs is still poor and their solderability performances are always deteriorated after the multiple lead-free reflow cycles. This article presents experimental data to illustrate the newly developed OSP coating in terms of thermal resistance, copper diffusion suppression and solderability.
  • Keywords
    copper; organic compounds; printed circuit manufacture; soldering; surface finishing; surface mount technology; thermal resistance; Cu; PCB application; Restriction of Hazardous Substances Directive; coated pads; copper diffusion suppression; copper surface; organic solderability preservative process; peak reflow temperature; printed circuit boards; protective surface finishing; soldering materials; surface co-planarity; surface mount technology; thermal resistance; Coatings; Copper; Films; Lead; Soldering; Surface finishing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microsystems, Packaging, Assembly and Circuits Technology Conference (IMPACT), 2013 8th International
  • Conference_Location
    Taipei
  • ISSN
    2150-5934
  • Type

    conf

  • DOI
    10.1109/IMPACT.2013.6706620
  • Filename
    6706620