DocumentCode :
671284
Title :
The evolution of organic solderability preservative (OSP) process in PCB application
Author :
Tong, K.H. ; Ku, M.T. ; Hsu, K.L. ; Tang, Qifu ; Chan, C.Y. ; Yee, K.W.
Author_Institution :
Dow Electron. Mater., Dow Chem. Co., Hong Kong, China
fYear :
2013
fDate :
22-25 Oct. 2013
Firstpage :
43
Lastpage :
46
Abstract :
The implementation of Restriction of Hazardous Substances Directive (RoHS) in 2006 has led to a requirement that soldering materials used in the fabrication of printed circuit boards (PCBs) should be lead-free. This change has raised the peak reflow temperature by 30 C as compared with a tin-lead process. A protective surface finishing should be designed to maintain good solderability, by preventing the copper surface from being oxidized, both during storage after PCB fabrication and during exposures to soldering temperatures. Organic solderability preservative (OSP) is considered as a preferred low cost surface mount technology (SMT)-compatible non-metallic surface finishing method, due to the excellent surface co-planarity of the coated pads. However, the protectiveness of some commercial available OSPs is still poor and their solderability performances are always deteriorated after the multiple lead-free reflow cycles. This article presents experimental data to illustrate the newly developed OSP coating in terms of thermal resistance, copper diffusion suppression and solderability.
Keywords :
copper; organic compounds; printed circuit manufacture; soldering; surface finishing; surface mount technology; thermal resistance; Cu; PCB application; Restriction of Hazardous Substances Directive; coated pads; copper diffusion suppression; copper surface; organic solderability preservative process; peak reflow temperature; printed circuit boards; protective surface finishing; soldering materials; surface co-planarity; surface mount technology; thermal resistance; Coatings; Copper; Films; Lead; Soldering; Surface finishing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microsystems, Packaging, Assembly and Circuits Technology Conference (IMPACT), 2013 8th International
Conference_Location :
Taipei
ISSN :
2150-5934
Type :
conf
DOI :
10.1109/IMPACT.2013.6706620
Filename :
6706620
Link To Document :
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