DocumentCode :
671313
Title :
Heat-resistance study of thermal release tape
Author :
Chieh-Yuan Chi ; Chun-Tang Lin ; Jung-Pang Huang ; Mu-Hsuan Chan ; Yan-Yi Liao ; Yan-Heng Chen ; Wei-Yu Chen
Author_Institution :
Siliconware Precision Ind. Co., Ltd., Taichung, Taiwan
fYear :
2013
fDate :
22-25 Oct. 2013
Firstpage :
35
Lastpage :
38
Abstract :
Thermal release tape is an unique tape that has three layers structure, including adhesive layer - base film and thermal release layer. These tapes behave like adhesive tape at room temperature but can be easily removed by heating at high temperature when we want to release this tape[1, 2]. Because these tapes are available in rolls for all automatic or manual wafer mounting systems, thermal release tape is widely applied in semiconductor package industry. In this paper, heat-resistance of thermal release tape were studied under some thermal conditions, such as (Y-30)°C/3hr-(Y-20)°C/3hr-(Y-10)°C/3hr and Y°C/3hr and we examine foaming phenomenon of tape. These results show that tape will lose fully foaming ability and become more difficultly to be released after long time heating on high temperature.
Keywords :
adhesives; foams; mountings; semiconductor device packaging; thin films; wafer level packaging; adhesive layer; adhesive tape; automatic wafer mounting systems; base film; foaming; heat resistance; manual wafer mounting systems; semiconductor package industry; temperature 293 K to 298 K; thermal release layer; thermal release tape; Films; Heating; IEEE catalog; Joining processes; Market research; Three-dimensional displays; Vehicles;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microsystems, Packaging, Assembly and Circuits Technology Conference (IMPACT), 2013 8th International
Conference_Location :
Taipei
ISSN :
2150-5934
Type :
conf
DOI :
10.1109/IMPACT.2013.6706649
Filename :
6706649
Link To Document :
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