DocumentCode
671313
Title
Heat-resistance study of thermal release tape
Author
Chieh-Yuan Chi ; Chun-Tang Lin ; Jung-Pang Huang ; Mu-Hsuan Chan ; Yan-Yi Liao ; Yan-Heng Chen ; Wei-Yu Chen
Author_Institution
Siliconware Precision Ind. Co., Ltd., Taichung, Taiwan
fYear
2013
fDate
22-25 Oct. 2013
Firstpage
35
Lastpage
38
Abstract
Thermal release tape is an unique tape that has three layers structure, including adhesive layer - base film and thermal release layer. These tapes behave like adhesive tape at room temperature but can be easily removed by heating at high temperature when we want to release this tape[1, 2]. Because these tapes are available in rolls for all automatic or manual wafer mounting systems, thermal release tape is widely applied in semiconductor package industry. In this paper, heat-resistance of thermal release tape were studied under some thermal conditions, such as (Y-30)°C/3hr-(Y-20)°C/3hr-(Y-10)°C/3hr and Y°C/3hr and we examine foaming phenomenon of tape. These results show that tape will lose fully foaming ability and become more difficultly to be released after long time heating on high temperature.
Keywords
adhesives; foams; mountings; semiconductor device packaging; thin films; wafer level packaging; adhesive layer; adhesive tape; automatic wafer mounting systems; base film; foaming; heat resistance; manual wafer mounting systems; semiconductor package industry; temperature 293 K to 298 K; thermal release layer; thermal release tape; Films; Heating; IEEE catalog; Joining processes; Market research; Three-dimensional displays; Vehicles;
fLanguage
English
Publisher
ieee
Conference_Titel
Microsystems, Packaging, Assembly and Circuits Technology Conference (IMPACT), 2013 8th International
Conference_Location
Taipei
ISSN
2150-5934
Type
conf
DOI
10.1109/IMPACT.2013.6706649
Filename
6706649
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