• DocumentCode
    671313
  • Title

    Heat-resistance study of thermal release tape

  • Author

    Chieh-Yuan Chi ; Chun-Tang Lin ; Jung-Pang Huang ; Mu-Hsuan Chan ; Yan-Yi Liao ; Yan-Heng Chen ; Wei-Yu Chen

  • Author_Institution
    Siliconware Precision Ind. Co., Ltd., Taichung, Taiwan
  • fYear
    2013
  • fDate
    22-25 Oct. 2013
  • Firstpage
    35
  • Lastpage
    38
  • Abstract
    Thermal release tape is an unique tape that has three layers structure, including adhesive layer - base film and thermal release layer. These tapes behave like adhesive tape at room temperature but can be easily removed by heating at high temperature when we want to release this tape[1, 2]. Because these tapes are available in rolls for all automatic or manual wafer mounting systems, thermal release tape is widely applied in semiconductor package industry. In this paper, heat-resistance of thermal release tape were studied under some thermal conditions, such as (Y-30)°C/3hr-(Y-20)°C/3hr-(Y-10)°C/3hr and Y°C/3hr and we examine foaming phenomenon of tape. These results show that tape will lose fully foaming ability and become more difficultly to be released after long time heating on high temperature.
  • Keywords
    adhesives; foams; mountings; semiconductor device packaging; thin films; wafer level packaging; adhesive layer; adhesive tape; automatic wafer mounting systems; base film; foaming; heat resistance; manual wafer mounting systems; semiconductor package industry; temperature 293 K to 298 K; thermal release layer; thermal release tape; Films; Heating; IEEE catalog; Joining processes; Market research; Three-dimensional displays; Vehicles;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microsystems, Packaging, Assembly and Circuits Technology Conference (IMPACT), 2013 8th International
  • Conference_Location
    Taipei
  • ISSN
    2150-5934
  • Type

    conf

  • DOI
    10.1109/IMPACT.2013.6706649
  • Filename
    6706649