DocumentCode :
671504
Title :
Complex-valued bidirectional auto-associative memory
Author :
Suzuki, Yuya ; Kobayashi, Masato
Author_Institution :
Interdiscipl. Grad. Sch. of Med. & Eng., Univ. of Yamanashi, Kofu, Japan
fYear :
2013
fDate :
4-9 Aug. 2013
Firstpage :
1
Lastpage :
7
Abstract :
Complex-valued Hopfield Associative Memory (CHAM) can store multi-valued patterns. But CHAM stores not only given training patterns but also many spurious patterns, such as their rotated patterns, at the same time. These rotated patterns and spurious patterns reduce the noise robustness of the CHAM. In the present work, we propose Complex-valued Bidirectional Auto-Associative Memory (CBAAM) as a model of auto-associative memory which improves the noise robustness. CBAAM consists of two layers. Although the structure of CBAAM is a Bidirectional Associative Memory (BAM), CBAAM works as an auto-associative memory, because the one layer is a visible layer and the other one is an invisible layer. The visible layer consists of complex-valued neurons and can process multi-valued patterns. The invisible layer consists of real-valued neurons and can reduce pseudo-memory such as rotated patterns. Thus, CBAAM has strong noise robustness. In the computer simulations, we show that the noise robustness of CBAAM highly exceeds that of CHAM. Especially, we find that CBAAM maintains high noise robustness independent of the resolution factor.
Keywords :
content-addressable storage; recurrent neural nets; CBAAM; CHAM; complex-valued Hopfield associative memory; complex-valued bidirectional auto-associative memory; complex-valued neurons; invisible layer; multivalued patterns; noise robustness; pseudo-memory reduction; real-valued neurons; resolution factor; visible layer; Associative memory; Computer simulation; Hebbian theory; Neurons; Noise; Noise robustness; Training;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Neural Networks (IJCNN), The 2013 International Joint Conference on
Conference_Location :
Dallas, TX
ISSN :
2161-4393
Print_ISBN :
978-1-4673-6128-6
Type :
conf
DOI :
10.1109/IJCNN.2013.6706844
Filename :
6706844
Link To Document :
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