Probabilistic gate matrix for axon-inspired communication

Communication on an axon could be modeled by an array of logic gates, where each logic gate emulates a voltage-gated ion channel. In this paper the probability of correct communication is estimated using such a model and an associated reliability analysis for logic gates/circuits known as probabilistic gate matrix (PGM). Such an approach can easily be extended to other types of (regular) arrays of logic gates, and to more complex connection patterns, including even feedbacks (that could model the time dependence of neighboring voltage-gated ion channels on any given voltage-input ion channel).