DocumentCode
672106
Title
Studies of high performances 3D nanorods n-i-p diode oxygen sensor
Author
Ming-Chun Hsieh ; Shao-Hua Wu ; Jair, David-King ; Yean-Kuen Fang ; You-Chi Chen
Author_Institution
Dept. of Electron. Eng., Kun Shan Univ., Tainan, Taiwan
fYear
2013
fDate
6-9 Oct. 2013
Firstpage
59
Lastpage
62
Abstract
In this study, a high performances Pd/WO3/ i-amorphous carbon /p-Si/Al n-i-p Schottky diode with 3D nanorods structure was developed by DC bias-assisted hot-wire chemical vapor deposition (DB-HWCVD). All of the sensing layers were prepared by sputtering, except, the amorphous carbon film was deposited by a DB-HWCVD system. We used Raman, XRD, SEM and AFM, for bond structure measurement, analyzing crystalline, examination of surface roughness and morphology inspection, respectively. Based on the SEM images, we can see that at the etching temperature of 90°C and etching time of 60 minutes can get the best quality nanorods structure. To measure the voltage sensitivity of the device, current-voltage (I-V) curves were displayed on a curve tracer (HP 4145B). Experimental results show that, in 2D thin film structure, under 3000 ppm, the WO3 sensor has the highest sensitivity of 199% (100°C) and 496% (400°C), respectively. Compared to the reported O2 sensors, we achieved the higher sensitivity, lower operation temperature and wider sensing range.
Keywords
Raman spectra; Schottky diodes; X-ray diffraction; aluminium; amorphous state; atomic force microscopy; chemical vapour deposition; elemental semiconductors; gas sensors; nanorods; nanosensors; scanning electron microscopy; silicon; sputter deposition; surface morphology; surface roughness; thin films; tungsten compounds; 2D thin film structure; AFM; DC bias-assisted hot-wire chemical vapor deposition; Pd-WO3-C-Si-Al; Raman spectra; SEM; Schottky diode; XRD; amorphous carbon film; bond structure measurement; current-voltage curves; etching; high performances 3D nanorods n-i-p diode oxygen sensor; morphology inspection; sputtering; surface roughness; temperature 90 degC; time 60 min; Carbon; Films; Nanoscale devices; TV; Wavelength measurement; HWCVD; nanorod; oxygen gas sensors; sensitivity; tungsten oxide;
fLanguage
English
Publisher
ieee
Conference_Titel
Nanotechnology Materials and Devices Conference (NMDC), 2013 IEEE 8th
Conference_Location
Tainan
Print_ISBN
978-1-4799-3386-0
Type
conf
DOI
10.1109/NMDC.2013.6707454
Filename
6707454
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