Title :
Closed-Loop Compensation of Dielectric Charge Induced by Ionizing Radiation
Author :
Dominguez-Pumar, Manuel ; Gorreta, Sergi ; Pons-Nin, Joan ; Gomez-Rodriguez, Faustino ; Gonzalez-Castano, Diego M. ; Muschitiello, Michele
Author_Institution :
Dept. of Electron. EngineeringMicro & Nano Technol. Group, Univ. Politec. de Catalunya, Barcelona, Spain
Abstract :
This letter investigates the capability of dielectric charge control loops to cope with charge induced by ionizing radiation. To this effect, an microelectromechanical systems (MEMS) variable capacitor has been irradiated with X-rays and gamma-radiation in three scenarios: without polarization; using an open-loop dielectric charge mitigation strategy; and using a closed-loop control method. The results show that the charge effects induced by radiation can be partially compensated using dielectric charge control.
Keywords :
capacitors; closed loop systems; compensation; electric charge; ionisation; micromechanical devices; radiation hardening (electronics); MEMS; X-ray irradiation; capacitor; closed-loop compensation; closed-loop control method; dielectric charge control; dielectric charge control loop; gamma-radiation; ionizing radiation; microelectromechanical system; open-loop dielectric charge mitigation strategy; polarization; Capacitance measurement; Dielectrics; Ionizing radiation; Microelectromechanical systems; Micromechanical devices; Radiation effects; X-rays; Dielectric charging control; MEMS reliability; ionizing radiation; ionizing radiation.; radiation effects;
Journal_Title :
Microelectromechanical Systems, Journal of
DOI :
10.1109/JMEMS.2015.2428733
