Millimeter and submillimeter planar measurement setup

A three-axes planar measurement setup for antenna characterization and inverse scattering applications is described. The need for a new measurement facility capable of working at millimeter and sub millimeter frequency bands is the main motivation of this work. The system can be divided into two main blocks devoted to mechanical and radiofrequency control respectively. Frequency band is extended up to 330 GHz by means of mixing heads, and a working surface of 1450×1500×1100 mm, with 0.01 mm positioning accuracy is achieved. Measurement setup is provided with an easy-to-use graphical user interface allowing configuration of mechanical and radiofrequency devices, as well as graphical representation of the results and post processing tasks.