DocumentCode :
673456
Title :
A new approach for in-situ scan impedance characterization of scanned antenna arrays
Author :
Christian, Thomas E. ; Hung Loui ; Christodoulou, Christos G. ; Dubbert, Dale F.
Author_Institution :
ISR EM & Sensor Tech. Org., Sandia Nat. Labs., Albuquerque, NM, USA
fYear :
2013
fDate :
7-13 July 2013
Firstpage :
304
Lastpage :
305
Abstract :
Scanned phased array antennas require active scan impedance determination and mitigation. This paper addresses the former by introducing a novel in-situ measurement architecture and associated mathematics for efficiently determining the real-time active scan impedance of arbitrary sized scanned arrays in the field. The in-situ nature of the proposed architecture reduces the need for large numerical simulation and/or estimation of scan impedance variations due to possible diverse antenna array placement in the field. Direct experimental characterization also enables direct validation of numerical simulation. The mathematics developed are for an M by N antenna array utilizing direct in-situ mutual coupling characterization. The mathematical model was implemented in MATLAB and verified through simulation using CST Microwave Studio (MWS) for a 2×2 monopole planar antenna array. The model´s robustness is tested by varying the inter-element spacing.
Keywords :
antenna phased arrays; monopole antenna arrays; numerical analysis; planar antenna arrays; CST Microwave Studio; MATLAB; MWS; active scan impedance determination; active scan impedance mitigation; arbitrary sized scanned arrays; direct in-situ mutual coupling characterization; diverse antenna array placement; inter-element spacing; mathematical model; measurement architecture; monopole planar antenna array; numerical simulation; real-time active scan impedance; scanned phased array antennas; Antenna arrays; Antenna measurements; Impedance; Mathematical model; Mutual coupling; Ports (Computers); Reflection coefficient;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Antennas and Propagation Society International Symposium (APSURSI), 2013 IEEE
Conference_Location :
Orlando, FL
ISSN :
1522-3965
Print_ISBN :
978-1-4673-5315-1
Type :
conf
DOI :
10.1109/APS.2013.6710813
Filename :
6710813
Link To Document :
بازگشت