• DocumentCode
    67349
  • Title

    A Novel Approach to Extract the Thyristor Design Parameters for Designing of Power Electronic Systems

  • Author

    Jedidi, Atef ; Garrab, Hatem ; Morel, Herve ; Besbes, Kamel

  • Author_Institution
    Dept. of Phys., Univ. of Monastir, Monastir, Tunisia
  • Volume
    62
  • Issue
    4
  • fYear
    2015
  • fDate
    Apr-15
  • Firstpage
    2174
  • Lastpage
    2183
  • Abstract
    Accurate simulation is an essential task in designing of integrated power systems to predict their electrical behavior. Thus, a very good description of their wiring circuits is required, and the availability of accurate models of power semiconductor devices and associated design parameters is crucial. This paper focuses on a novel extraction approach of design parameters for a 1-D finite-element-method model of the thyristor. These design parameters are also essential for physics-based analytical models. This paper presents an extraction procedure of the main design parameters of an ultrafast thyristor: the effective area of the device, the ambipolar lifetime, the doping concentration and width of the low-doped base region, and the doping concentration and width of the gate region. The extraction procedure of the thyristor design parameter is based on a comparative computation between simulation and experimental results, taking into account the physics of the component. Measurements are carried out on a sophisticated test circuit, which must be modeled with a sufficient accuracy. This paper details the parameter extraction procedure. Various electrothermal simulation results about the thyristor under test, using the extracted values of design parameters, show good agreement with experiment and confirm the validity of the presented extraction procedure.
  • Keywords
    finite element analysis; integrated circuit metallisation; integrated circuit testing; power electronics; semiconductor device models; semiconductor doping; thyristor circuits; 1D finite element method model; ambipolar lifetime; doping concentration; electrical behavior; electrothermal simulation; gate region; integrated power systems; low-doped base region; physics-based analytical models; power electronic systems; power semiconductor devices; test circuit; thyristor design parameters; ultra-fast thyristor; wiring circuits; Insulated gate bipolar transistors; Integrated circuit modeling; Logic gates; MOSFET; Semiconductor process modeling; Thyristors; Finite-element method (FEM); modeling; simulation; thyristors;
  • fLanguage
    English
  • Journal_Title
    Industrial Electronics, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0278-0046
  • Type

    jour

  • DOI
    10.1109/TIE.2014.2356440
  • Filename
    6897998