DocumentCode
673516
Title
Permeability and permittivity extraction issues for non-Foster and active metamaterials
Author
Shehan, Joshua W. ; Covington, John M. C. ; Kshatri, Varun S. ; Weldon, Thomas P. ; Adams, Ryan S.
Author_Institution
Dept. of Electr. & Comput. Eng., Univ. of North Carolina at Charlotte, Charlotte, NC, USA
fYear
2013
fDate
7-13 July 2013
Firstpage
500
Lastpage
501
Abstract
Although a variety of methods have been proposed for the extraction of effective permittivity and permeability of metamaterials, certain underlying passivity constraints and assumptions would not be suitable for non-Foster metamaterials that incorporate active devices and power sources. Moreover, recent arguments suggest that a common passivity constraint in extraction methods does not resolve solution branch ambiguities. To address these issues, the fundamental principles of parameter extraction are revisited for the case of active materials where passivity cannot be assumed. The analysis follows along the lines of Nicolson-Ross-Weir approaches, where parameters are extracted from measured two-port S-parameters. It is shown that a convergence constraint for active materials requires that the magnitude of the product of the transmission coefficient and reflection coefficient must be less than unity. This allows metamaterials with gain, and simulation results are provided for a slab of active material that exhibits gain and satisfies the constraint.
Keywords
electromagnetic metamaterials; electromagnetic wave reflection; electromagnetic wave transmission; permeability; permittivity; Nicolson-Ross-Weir approach; active metamaterial; non-Foster metamaterial; parameter extraction; permeability extraction method; permittivity extraction method; reflection coefficient; transmission coefficient; two port S-parameters; Metamaterials; Parameter extraction; Permeability; Permittivity; Scattering parameters; Slabs;
fLanguage
English
Publisher
ieee
Conference_Titel
Antennas and Propagation Society International Symposium (APSURSI), 2013 IEEE
Conference_Location
Orlando, FL
ISSN
1522-3965
Print_ISBN
978-1-4673-5315-1
Type
conf
DOI
10.1109/APS.2013.6710911
Filename
6710911
Link To Document