DocumentCode
673656
Title
Analysis of electromagnetic wave radiation from C-slot RFID tag mounted on impedance curved surface using the UTD solution
Author
Wongsiritorn, Pitchanun ; Phongcharoenpanich, Chuwong ; Pumpoung, Tajchai ; Lertwiriyaprapa, Titipong ; Phaebua, Kittisak
Author_Institution
Fac. of Eng., King Mongkut´s Inst. of Technol. Ladkrabang, Bangkok, Thailand
fYear
2013
fDate
7-13 July 2013
Firstpage
1076
Lastpage
1077
Abstract
The electromagnetic (EM) wave radiation of the C-slot radio frequency identification (RFID) tag located on the impedance surface in this paper is analyzed using the uniform geometrical theory of diffraction (UTD) solution. The UTD radiation solution for the impedance curved surface is employed to predict the EM wave radiation of the RFID tag mounted on the impedance curved product surface. The UTD radiation solution provides the physical insight of the EM field at the observation point and requires less computational time than the other numerical methods. The results show that the UTD radiation solution can accurately predict the radiation pattern of the proposed C-slot RFID tag mounted on the product. The proposed tag antenna can efficiently be applied to the curved surface object, such as the curved metallic product coated with dielectric (layers of paints).
Keywords
UHF antennas; UHF radio propagation; antenna radiation patterns; electromagnetic fields; electromagnetic wave diffraction; electromagnetic waves; radiofrequency identification; slot antennas; C-slot RFID tag; UTD solution; curved metallic product; curved surface object; dielectric layer; electromagnetic field; electromagnetic wave radiation; impedance curved surface; impedance surface; radiation pattern; radio frequency identification tag; uniform geometrical theory of diffraction; Antenna radiation patterns; Impedance; Radiofrequency identification; Surface impedance; Surface treatment; Surface waves;
fLanguage
English
Publisher
ieee
Conference_Titel
Antennas and Propagation Society International Symposium (APSURSI), 2013 IEEE
Conference_Location
Orlando, FL
ISSN
1522-3965
Print_ISBN
978-1-4673-5315-1
Type
conf
DOI
10.1109/APS.2013.6711198
Filename
6711198
Link To Document