DocumentCode :
674334
Title :
Finite element analysis for distribution of surface charge on current-carrying conductor
Author :
Suk Min Hong ; Il Han Park
Author_Institution :
Sch. of Electron. & Electr. Eng., Sungkyunkwan Univ., Suwon, South Korea
fYear :
2013
fDate :
26-29 Oct. 2013
Firstpage :
868
Lastpage :
872
Abstract :
The purpose of this paper is to analyze distribution of surface charge density on DC-carrying conductor. A new numerical analysis method, based on finite element method, is proposed in this paper. Basically the method consists of two steps: first is to calculate inside field of conductor and second is to calculate outside field. Knowing the charge distribution on the conductor surface helps better understanding of the current in conductor and will be useful for extracting parasitic circuit parameters and modeling on-chip interconnects etc.
Keywords :
conductors (electric); finite element analysis; surface charging; current-carrying conductor; finite element analysis; on-chip interconnect modeling; surface charge distribution; Atmospheric modeling; Conductors; Electric fields; Electrodes; Finite element analysis; Wires; Conductor; finite element method; parasitic circuit parameter; surface charge density;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electrical Machines and Systems (ICEMS), 2013 International Conference on
Conference_Location :
Busan
Print_ISBN :
978-1-4799-1446-3
Type :
conf
DOI :
10.1109/ICEMS.2013.6713136
Filename :
6713136
Link To Document :
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