Title :
The imaging approach of sparse interferometry to microwave radiation
Author :
Yuanyuan Liu ; Suhua Chen ; Lu Zhu
Author_Institution :
Sch. of Inf. Eng., East China Jiaotong Univ., Nanchang, China
Abstract :
High efficiency image reconstruction and inversion algorithm is one of the key technologies for interference synthetic aperture microwave radiometer. Due to the fact that the brightness temperature of the Earth has a local smoothness characteristic, it could be random sparse interferometry. Based on compressive sensing, this paper proposes a novel imaging approach of sparse interferometry to microwave radiation. According to the sparity of the image and the characteristic of the interferometry, we set up the microwave radiation sparse interferometric imaging model using Total Variation constraints on the basis of the traditional microwave radiation imaging. In the model, we use a new sparse interferometry to sample frequency information on the basis of the sparse antenna array. During the process of microwave radiation inversion imaging, we use the steepest descent method and the alternate iteration method reconstruct. Experimental results show that the proposed approach is able to rapid, accurate and efficient inverse microwave radiation image.
Keywords :
compressed sensing; image reconstruction; microwave imaging; radar imaging; radar interferometry; synthetic aperture radar; Earth; brightness temperature; compressive sensing; high efficiency image reconstruction; imaging approach; interference synthetic aperture microwave radiometer; inversion algorithm; microwave radiation; sparse interferometry; Antennas; Brightness; Image coding; Image resolution; Optimization; Radio interferometry; Radiometry; Alternating Direction Algorithm; TV reconstruction algorithm; Total Variation; compressive sensing; image inversion; interference synthetic aperture microwave radiometer; random sparse interference method; steepest descent method;
Conference_Titel :
Antennas & Propagation (ISAP), 2013 Proceedings of the International Symposium on
Conference_Location :
Nanjing
Print_ISBN :
978-7-5641-4279-7