Title : 
An Estimator of Solar Irradiance in Photovoltaic Arrays With Guaranteed Stability Properties
         
        
            Author : 
Carrasco, Miguel ; Mancilla-David, Fernando ; Ortega, Romeo
         
        
            Author_Institution : 
Dept. of Electr. Eng., Univ. of Colorado, Denver, CO, USA
         
        
        
        
        
        
        
        
            Abstract : 
Photovoltaic cells are characterized via a static relationship that describes their current-voltage relationship. This relationship is a complicated implicit algebraic equation that depends, in a nonlinear way, on two critical uncertain parameters: temperature and solar irradiance. The efficient operation of the panel relies on the knowledge of these key parameters. While it is technologically feasible to measure the former, a sensor for the latter is usually expensive and difficult to calibrate. In this paper, we propose a globally convergent estimator for solar irradiance which is developed using the principles of immersion and invariance recently reported in the control literature. To design the estimator, a suitable reparameterization of the current-voltage characteristic, which effectively exhibits a monotonic behavior, is introduced. The approach is validated through detailed computer simulations and experimental prototyping using real outdoor measurements.
         
        
            Keywords : 
photovoltaic power systems; solar cell arrays; stability; complicated implicit algebraic equation; computer simulations; critical uncertain parameters; current-voltage characteristic; current-voltage relationship; globally convergent estimator; guaranteed stability properties; photovoltaic arrays; photovoltaic cells; solar irradiance; Current measurement; Mathematical model; Maximum power point trackers; Temperature; Temperature measurement; Temperature sensors; Nonlinear parametrization; parameter estimation; photovoltaic (PV) power systems; renewable energy; solar radiation;
         
        
        
            Journal_Title : 
Industrial Electronics, IEEE Transactions on
         
        
        
        
        
            DOI : 
10.1109/TIE.2013.2281154