Title :
Phase congruency image and sparse classifier for newborn classifying pain state
Author :
Mansor, Muhammad Naufal ; Rejab, Mohd Nazri
Author_Institution :
Sch. of Mehatronic Eng., Univ. Malaysia Perlis, Arau, Malaysia
fDate :
Nov. 29 2013-Dec. 1 2013
Abstract :
Most of infant pain cause changes in the face. Clinicians use image analysis to characterize the pathological faces. Nowadays, infant pain research is increasing dramatically due to high demand from all medical team. This paper presents a sparse and naïve Bayes classifier for the diagnosis of infant pain disorders. Phase congruency image and local binary pattern are proposed. The proposed algorithms provide very promising classification rate.
Keywords :
Bayes methods; emotion recognition; face recognition; image classification; medical disorders; medical image processing; paediatrics; image analysis; infant pain disorder; local binary pattern; naïve Bayes classifier; newborn classifying pain state; pathological faces; phase congruency image classifier; sparse classifier; Conferences; Databases; Feature extraction; Noise level; Pain; Pediatrics; Phase measurement; Infant Pain; Local Binary Pattern; Naïve Bayes Classifier; Phase congruency image; Sparse Classifier;
Conference_Titel :
Control System, Computing and Engineering (ICCSCE), 2013 IEEE International Conference on
Conference_Location :
Mindeb
Print_ISBN :
978-1-4799-1506-4
DOI :
10.1109/ICCSCE.2013.6720007