• DocumentCode
    677240
  • Title

    Infant cry classification: Time frequency analysis

  • Author

    Saraswathy, J. ; Hariharan, M. ; Khairunizam, Wan ; Yaacob, Sazali ; Thiyagar, N.

  • Author_Institution
    Sch. of Mechatron. Eng., Univ. Malaysia Perlis (UniMAP), Arau, Malaysia
  • fYear
    2013
  • fDate
    Nov. 29 2013-Dec. 1 2013
  • Firstpage
    499
  • Lastpage
    504
  • Abstract
    Acoustic analysis of infant cry has been the subject of a number of researchers since half decades ago. This paper addresses a simple time-frequency analysis based signal processing technique using short-time Fourier transform (STFT) for the investigation and classification of infant cry signals. A cluster of statistical features are derived from the time-frequency plots of infant cry signals. The extracted feature vectors are used to model and train two types of radial basis neural network namely Probabilistic Neural Network (PNN) and General Regression Neural Network (GRNN) in classification phases. Three classes of infant cry signals are considered such as normal cry signals cry signals from deaf infants and infants with asphyxia. Promising classification results above 99% reveals that the proposed features and classification technique can effectively classify different infant cries.
  • Keywords
    Fourier transforms; acoustic signal processing; radial basis function networks; signal classification; statistical analysis; time-frequency analysis; vectors; GRNN; PNN; STFT; acoustic analysis; feature vectors; general regression neural network; infant cry classification; probabilistic neural network; radial basis neural network; short-time Fourier transform; signal processing; statistical features; time frequency analysis; Accuracy; Asphyxia; Feature extraction; Neural networks; Pediatrics; Time-frequency analysis; Acoustic analysis; classification; infant cry; signal processing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Control System, Computing and Engineering (ICCSCE), 2013 IEEE International Conference on
  • Conference_Location
    Mindeb
  • Print_ISBN
    978-1-4799-1506-4
  • Type

    conf

  • DOI
    10.1109/ICCSCE.2013.6720016
  • Filename
    6720016