DocumentCode :
677279
Title :
Testing FPGA devices on an Automatic Test Equipment
Author :
Xie Weikun ; Zhang Huibin ; Zhang Qiuli
Author_Institution :
Test Center, China Electron. Technol. Group Corp., Wuxi, China
fYear :
2013
fDate :
26-28 Aug. 2013
Firstpage :
65
Lastpage :
70
Abstract :
With the rapid development of IC technology, the application of FPGA becomes more and more widely, more than 90% embedded system design engineers of the world are using the FPGA for a wide variety of designs. The rapid development of FPGA brings new opportunities and challenges for test manufacturers, a variety of innovative testing technologies and solutions for FPGA have been developed. This paper gives a brief introduction to the FPGA test approach on an Automatic Test Equipment(ATE), describes the method of FPGA configuration mode selection and FPGA configuration code generation , gives a detailed description of the FPGA configuration and testing process with a Virtex-6 FPGA-XC6VLX240T . At last, this paper discusses the DC and Function test methods.
Keywords :
automatic test equipment; field programmable gate arrays; logic testing; ATE; DC test methods; FPGA configuration code generation; FPGA configuration mode selection; FPGA test approach; IC technology; Virtex-6 FPGA-XC6VLX240T; automatic test equipment; function test methods; test manufacturers; Companies; Field programmable gate arrays; Pins; Synchronization; Testing; Vectors; ATE; Configuration; FPGA; Test;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Information and Automation (ICIA), 2013 IEEE International Conference on
Conference_Location :
Yinchuan
Type :
conf
DOI :
10.1109/ICInfA.2013.6720271
Filename :
6720271
Link To Document :
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