DocumentCode :
677366
Title :
A simple inspection technique of visual defects of polymer polarizer
Author :
Yuanlong Deng ; Feng Luo ; Yubin Wu ; Xiaopin Zhong
Author_Institution :
ShenZhen Key Lab. of Sensor Technol., Shenzhen Univ., Shenzhen, China
fYear :
2013
fDate :
26-28 Aug. 2013
Firstpage :
1120
Lastpage :
1123
Abstract :
In order to inspect the visual defects of polymer polarizer, an off-line automatic optical system (AOI) is proposed in this paper. It employs a plane CCD camera to capture the image of polarizer, and the Vision-Development-Module (VDM) © to process and analyze the image. Simple algorithm to determine the key parameters, such as the range of gray level equalization and the segmentation threshold, is implemented in the LabVIEW2012©. Experimental results demonstrate the validity of the algorithm, and classification, location and size of visual defects are extracted successfully.
Keywords :
CCD image sensors; automatic optical inspection; image segmentation; liquid crystal displays; polymers; production engineering computing; virtual instrumentation; CCD camera; LabVIEW2012; VDM process; automatic optical system; gray level equalization; image processing; image segmentation; image thresholding; inspection technique; polymer polarizers; vision development module; visual defects; Charge coupled devices; Image segmentation; Inspection; Object segmentation; Polymers; Thin film transistors; Visualization; Automatic optical inspection; Polarizer; TFT-LCD; Vision-Development-Module; Visual defects;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Information and Automation (ICIA), 2013 IEEE International Conference on
Conference_Location :
Yinchuan
Type :
conf
DOI :
10.1109/ICInfA.2013.6720463
Filename :
6720463
Link To Document :
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