Title :
High throughput asynchronous NoC switch for high process variation
Author :
Ezz-Eldin, Rabab ; El-Moursy, Magdy A. ; Hamed, Hesham F. A.
Author_Institution :
Electron. Eng. Dept., Bani-suef Univ., Bani-suef, Egypt
Abstract :
Asynchronous NoC switch is proposed as a robust design to mitigate the impact of process variation. Circuit analysis is used to evaluate the influence of process variation on both synchronous and asynchronous designs. The delay and throughput variation are evaluated with different technologies. Although the asynchronous switch has large delay variation as compared to synchronous switch, high throughput is achieved under high process variation conditions. The throughput remains unchanged under high process variation conditions in asynchronous NoC switch, while the throughput of synchronous switch is rapidly reduced at the same conditions.
Keywords :
integrated circuit design; network analysis; network-on-chip; asynchronous designs; circuit analysis; delay variation; high process variation conditions; high throughput asynchronous NoC switch; network on chip; synchronous designs; throughput variation; Delays; Ports (Computers); Protocols; Routing; Switches; Synchronization; Throughput; Asynchronous design; Network on Chip; Process Variation; Synchronous design;
Conference_Titel :
Design and Test Symposium (IDT), 2013 8th International
Conference_Location :
Marrakesh
DOI :
10.1109/IDT.2013.6727079