• DocumentCode
    679577
  • Title

    An adaptive total variation regularization method for electrical resistance tomography

  • Author

    YanBin Xu ; Xizi Song ; Feng Dong ; Huaxiang Wang

  • Author_Institution
    Tianjin Key Lab. of Process Meas. & Control, Tianjin Univ., Tianjin, China
  • fYear
    2013
  • fDate
    22-23 Oct. 2013
  • Firstpage
    127
  • Lastpage
    131
  • Abstract
    Total variation (TV) regularization method is widely used to solve the inverse problem of Electrical resistance tomography (ERT), which is ill-posed. However, TV regularization often suffers the staircases effect. To reduce those staircases effect, a modified TV regularization, called adaptive total variation (ATV) regularization, is proposed in this paper, which automatically adjusts the regularization term by distinguishing between edges and ramps according to the image gradients. With adaptive regularization term, at block edges it behaves more like the TV functional (∫Ω|∇u|dΩ) to perverse the edges and in ramp regions it behaves more like the H1 functional (∫Ω|∇u|2dΩ) to avoid the staircase effect. Simulation and experimental results of ATV regularization and TV regularization are compared, which show that ATV regularization can avoid the staircase effect and endure a relatively high level of noise in the measured voltages.
  • Keywords
    edge detection; electric impedance imaging; inverse problems; measurement errors; variational techniques; ATV regularization; adaptive total variation regularization method; automatic regularization adjustment; edge detection; electrical resistance tomography; ill pose problem; image gradient; inverse problem; measurement noise; ramp regions; staircases effect reduction; Conductivity; Image edge detection; Image reconstruction; Noise; TV; Tomography; Voltage measurement; adaptive total variation; electrical resistance tomography; image reconstruction; total variation regularization;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Imaging Systems and Techniques (IST), 2013 IEEE International Conference on
  • Conference_Location
    Beijing
  • Print_ISBN
    978-1-4673-5790-6
  • Type

    conf

  • DOI
    10.1109/IST.2013.6729676
  • Filename
    6729676