Image processing-based technology for dirt detection of quartz wafer

Quartz wafer inevitably produces various physical defects in the production process. This paper focuses on the quartz wafer dirt defects, and proposes a way for image processing on the quartz wafer by using of computer vision library OpenCV. The proposed method is to find contours of the processed images to judge whether there is dirt or not. Experiments show that this method can well detect the dirt of quartz wafer.