• DocumentCode
    682195
  • Title

    Research on metrology for microwave landing system simulator

  • Author

    Li Qiongwei ; Yu Suya ; Xue Fei ; Ma Wenjing

  • Author_Institution
    Aero-Instrum. Test & Calibration Center, Beijing, China
  • Volume
    1
  • fYear
    2013
  • fDate
    16-19 Aug. 2013
  • Firstpage
    32
  • Lastpage
    36
  • Abstract
    The author presents the series of research achievement on metrology for microwave landing system (MLS) simulator, including demonstration for parameter system of metrology, methology for metrology support and development of automatic metrology system. The application shows that the findings have surmounted technical difficulties of MLS simulator metrology support and ensured the parameters accuracy and consistency of MLS, which make sense for improving flight safety.
  • Keywords
    aerospace simulation; measurement standards; microwave landing systems; automatic metrology system; flight safety; metrology support; microwave landing system simulator; parameter system; Azimuth; Calibration; Instruments; Metrology; Microwave measurement; Software; Standards; calibration; measurement standard; metrology; microwave landing system (MLS); simulator;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Measurement & Instruments (ICEMI), 2013 IEEE 11th International Conference on
  • Conference_Location
    Harbin
  • Print_ISBN
    978-1-4799-0757-1
  • Type

    conf

  • DOI
    10.1109/ICEMI.2013.6743032
  • Filename
    6743032
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=682195