Design for digital oscilloscopes with seamless measurement capability

Author

Jiang Jun ; Hou Miaolin ; Tian Shulin

Author_Institution

Sch. of Autom. Eng., Univ. of Electron. Sci. & Technol. of China, Chengdu, China

Volume

1

fYear

2013

fDate

16-19 Aug. 2013

Firstpage

306

Lastpage

311

Abstract

Modern complicated signal tests have very high requirements for the sampling and capturing performance of oscilloscopes, but the signal capturing performance of digital oscilloscopes greatly lags behind their sampling performance, appearing as low waveform capture rate and large measuring gap, which seriously inhibits the improvement of measurement capability and efficiency of oscilloscopes. In order to maximize the waveform capture rate and eliminate the measuring gap of oscilloscopes thoroughly, this article provides a design for digital oscilloscopes with seamless measurement capability, aiming at satisfying the requirements for seamless acquisition storage, seamless data processing and seamless image display for realizing the seamless measurement of the complete set by improving the structure and optimizing the processing mechanism of oscilloscopes.

Keywords

digital storage oscilloscopes; waveform analysis; digital oscilloscopes; seamless acquisition storage; seamless data processing; seamless image display; seamless measurement capability; waveform capture rate; Arrays; Data processing; Field programmable gate arrays; Oscilloscopes; Process control; Real-time systems; Time measurement; digital oscilloscope; measuring gap; seamless measurement; waveform capture rate;

fLanguage

English

Publisher

ieee

Conference_Titel

Electronic Measurement & Instruments (ICEMI), 2013 IEEE 11th International Conference on

Conference_Location

Harbin

Print_ISBN

978-1-4799-0757-1

Type

conf

DOI

10.1109/ICEMI.2013.6743038

Filename

6743038