DocumentCode :
682292
Title :
Environment factor assessment based on degradation data and reaction rate model
Author :
Wei Yukun ; Liu Zhen ; Long Bing ; Yang Chenglin
Author_Institution :
Sch. of Autom. Eng., Univ. of Electron. Sci. & Technol. of China, Chengdu, China
Volume :
2
fYear :
2013
fDate :
16-19 Aug. 2013
Firstpage :
890
Lastpage :
894
Abstract :
This paper presents a method to assess the environment factor, which is used to discount data at accelerated operating condition into data at normal condition. This method combines degradation data with reaction rate model, considers the interior relationship between environment stress and product´s degradation rate, which not only cut down the amount of work, but also can predict environment factor at some other stress. An approach based on the ratio of performance degradation rate is proposed to validate the results, and the effectiveness of proposed method is demonstrated by the example of carbon-film resistors.
Keywords :
environmental factors; failure analysis; degradation data; environment factor assessment; environment stress rate; product degradation rate; reaction rate model; Data models; Degradation; Instruments; Reliability; Resistors; Stress; Weibull distribution; Arrhenius model; Reaction Rate Model; Weibull distribution; degradation data; environment factor; pseudo life;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronic Measurement & Instruments (ICEMI), 2013 IEEE 11th International Conference on
Conference_Location :
Harbin
Print_ISBN :
978-1-4799-0757-1
Type :
conf
DOI :
10.1109/ICEMI.2013.6743168
Filename :
6743168
Link To Document :
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