DocumentCode
682292
Title
Environment factor assessment based on degradation data and reaction rate model
Author
Wei Yukun ; Liu Zhen ; Long Bing ; Yang Chenglin
Author_Institution
Sch. of Autom. Eng., Univ. of Electron. Sci. & Technol. of China, Chengdu, China
Volume
2
fYear
2013
fDate
16-19 Aug. 2013
Firstpage
890
Lastpage
894
Abstract
This paper presents a method to assess the environment factor, which is used to discount data at accelerated operating condition into data at normal condition. This method combines degradation data with reaction rate model, considers the interior relationship between environment stress and product´s degradation rate, which not only cut down the amount of work, but also can predict environment factor at some other stress. An approach based on the ratio of performance degradation rate is proposed to validate the results, and the effectiveness of proposed method is demonstrated by the example of carbon-film resistors.
Keywords
environmental factors; failure analysis; degradation data; environment factor assessment; environment stress rate; product degradation rate; reaction rate model; Data models; Degradation; Instruments; Reliability; Resistors; Stress; Weibull distribution; Arrhenius model; Reaction Rate Model; Weibull distribution; degradation data; environment factor; pseudo life;
fLanguage
English
Publisher
ieee
Conference_Titel
Electronic Measurement & Instruments (ICEMI), 2013 IEEE 11th International Conference on
Conference_Location
Harbin
Print_ISBN
978-1-4799-0757-1
Type
conf
DOI
10.1109/ICEMI.2013.6743168
Filename
6743168
Link To Document