• DocumentCode
    682292
  • Title

    Environment factor assessment based on degradation data and reaction rate model

  • Author

    Wei Yukun ; Liu Zhen ; Long Bing ; Yang Chenglin

  • Author_Institution
    Sch. of Autom. Eng., Univ. of Electron. Sci. & Technol. of China, Chengdu, China
  • Volume
    2
  • fYear
    2013
  • fDate
    16-19 Aug. 2013
  • Firstpage
    890
  • Lastpage
    894
  • Abstract
    This paper presents a method to assess the environment factor, which is used to discount data at accelerated operating condition into data at normal condition. This method combines degradation data with reaction rate model, considers the interior relationship between environment stress and product´s degradation rate, which not only cut down the amount of work, but also can predict environment factor at some other stress. An approach based on the ratio of performance degradation rate is proposed to validate the results, and the effectiveness of proposed method is demonstrated by the example of carbon-film resistors.
  • Keywords
    environmental factors; failure analysis; degradation data; environment factor assessment; environment stress rate; product degradation rate; reaction rate model; Data models; Degradation; Instruments; Reliability; Resistors; Stress; Weibull distribution; Arrhenius model; Reaction Rate Model; Weibull distribution; degradation data; environment factor; pseudo life;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Measurement & Instruments (ICEMI), 2013 IEEE 11th International Conference on
  • Conference_Location
    Harbin
  • Print_ISBN
    978-1-4799-0757-1
  • Type

    conf

  • DOI
    10.1109/ICEMI.2013.6743168
  • Filename
    6743168