Title :
A New Volume Integral Formulation for Broadband 3-D Circuit Extraction in Inhomogeneous Materials With and Without External Electromagnetic Fields
Author :
Omar, Saad ; Jiao, Dan
Author_Institution :
Sch. of Electr. & Comput. Eng., Purdue Univ., West Lafayette, IN, USA
Abstract :
A new first-principles-based volume integral equation (VIE) formulation is developed for the broadband full-wave extraction of general 3-D circuits, containing arbitrarily shaped lossy conductors with inhomogeneous dielectrics. The proposed formulation accentuates all the advantages of the VIE formulation traditionally developed for solving wave-related problems, while allowing for the extraction of multiport circuit parameters such as impedance Z-, admittance Y-, and scattering S-parameters at ports located anywhere in the physical structure of a circuit. Its first-principles-based formulation without circuit-based simplifications and approximations can also be utilized to analyze the performance of a circuit in adverse ambient conditions, such as the exposure to strong external electromagnetic fields. In addition, the magneto-quasi-static and electro-magneto-quasi-static counterparts of the proposed full-wave formulation are also given for low-frequency applications. Numerical experiments have validated the accuracy and capability of the proposed new VIE formulation.
Keywords :
conductors (electric); electric admittance; electric impedance; integral equations; integrated circuit modelling; multiport networks; three-dimensional integrated circuits; VIE formulation; admittance Y-parameters; arbitrarily shaped lossy conductors; broadband 3D circuit extraction; broadband full-wave extraction; circuit performance; circuit physical structure; external electromagnetic fields; first-principles-based formulation; first-principles-based volume integral equation formulation; full-wave formulation; general 3D circuits; impedance Z-parameters; inhomogeneous dielectrics; inhomogeneous materials; low-frequency applications; multiport circuit parameters; ports; scattering S-parameters; wave-related problems; Conductors; Electric potential; Integrated circuit modeling; Nonhomogeneous media; Ports (Computers); Surface impedance; 3-D structures; ${ S}$-parameter extraction; Broadband analysis; circuit modeling; external electromagnetic fields; full-wave analysis; impedance extraction; volume integral equations (VIEs);
Journal_Title :
Microwave Theory and Techniques, IEEE Transactions on
DOI :
10.1109/TMTT.2013.2285355