• DocumentCode
    682833
  • Title

    Improved 750 °C epitaxial crystal silicon solar cells through impurity reduction

  • Author

    Grover, Sachit ; Young, David L. ; LaSalvia, Vincenzo ; Li, Jian V. ; Branz, H.M. ; Stradins, Paul ; Teplin, Charles W.

  • Author_Institution
    Nat. Renewable Energy Lab., Golden, CO, USA
  • fYear
    2013
  • fDate
    16-21 June 2013
  • Abstract
    We characterize and improve epitaxial silicon films for solar cells grown by hot-wire chemical vapor deposition (HWCVD). The hot-wire filament temperature is found to affect the incorporation of impurities and the surface roughness of the films. Lowering the filament temperature leads to improved epitaxial films with lower impurities and smoother surfaces. Solar cells made with the improved material grown on low-cost silicon templates have open-circuit voltages (VOC) ~600 mV and efficiency exceeding 10%.
  • Keywords
    chemical vapour deposition; elemental semiconductors; epitaxial growth; impurities; semiconductor thin films; silicon; solar cells; surface roughness; HWCVD; Si; epitaxial crystal silicon solar cells; epitaxial silicon films; hot-wire chemical vapor deposition; hot-wire filament temperature; impurity reduction; low-cost silicon templates; open-circuit voltages; surface roughness; temperature 750 C; Epitaxial growth; Impurities; Photovoltaic cells; Plasma temperature; Silicon; DLTS; epitaxial silicon; hot-wire CVD; impurities; solar cells;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Photovoltaic Specialists Conference (PVSC), 2013 IEEE 39th
  • Conference_Location
    Tampa, FL
  • Type

    conf

  • DOI
    10.1109/PVSC.2013.6744097
  • Filename
    6744097