Title :
Field-induced anodization for silicon solar cell passivation
Author :
Lennon, Alison ; Jeeyeon Yeo ; Pei Hsuan Lu ; Yi Sun ; Xi Wang ; Zhong Lu ; Yang Li ; Vais, Valantis
Author_Institution :
Sch. of Photovoltaics & Renewable Energy Eng., Univ. of New South Wales, Sydney, NSW, Australia
Abstract :
Anodic aluminium oxide formed on silicon wafers can passivate phosphorus-doped silicon surfaces. We describe here a new method for forming these layers which involves forward-biasing a solar cell such that the n-type surface becomes anodic. Aluminium, deposited on the n-type silicon surface over a thin tunnel oxide, can be anodized to form a porous layer. However, unlike anodization processes where the aluminium is physically contacted, increases in effective minority carrier lifetime were only observed after a subsequent anneal at 400 °C in an industrial belt furnance. Anodic aluminium oxide layers formed over n-type silicon surfaces may find applications as rear surface passivation layers for n-type cells. Furthermore, the process can be adapted to the anodization of silicon and thus provide a low temperature method of forming thin silicon dioxide layers which are commonly-used in conjunction with other passivation layers.
Keywords :
aluminium compounds; annealing; anodisation; carrier lifetime; elemental semiconductors; passivation; phosphorus; silicon; solar cells; Si:P; field-induced anodization; industrial belt furnance; minority carrier lifetime; porous layer; rear surface passivation layers; silicon solar cell passivation; temperature 400 degC; thin tunnel oxide; Aluminum oxide; Annealing; Passivation; Photovoltaic cells; Silicon; anodic aluminium oxide; field-induced anodization; passivation; photovoltaic cells; silicon;
Conference_Titel :
Photovoltaic Specialists Conference (PVSC), 2013 IEEE 39th
Conference_Location :
Tampa, FL
DOI :
10.1109/PVSC.2013.6744369