Title :
Observation of light scattering properties of silicon nanowire arrays
Author :
Kurokawa, Yusuke ; Watanabe, Yoshihiro ; Kato, Shigeo ; Yamada, Y. ; Yamada, Akimasa ; Ohta, Yoshichika ; Niwa, Yusuke ; Hirota, Masafumi
Author_Institution :
Dept. of Phys. Electron., Tokyo Inst. of Technol., Tokyo, Japan
Abstract :
Silicon nanowire (SiNW) arrays were pre metal assisted chemical etching (MAE) method for the ap to solar cells. The SiNW arrays were mechanically peeled the Si substrate to obtain the optical properties of SiNW themselves. The absorptance of the SiNW array with the 10 μm is much higher than theoretical absorptance of 10 flat Si wafer. The angular distribution function (transmittance of SiNW arrays was also measured. It was that the Mie-related scattering plays an important ro strong optical confinement of the SiNW arrays.
Keywords :
Mie scattering; elemental semiconductors; etching; infrared spectra; light scattering; nanofabrication; nanowires; refractive index; silicon; solar cell arrays; ultraviolet spectra; visible spectra; Mie related scattering; Si; UV-visible-infrared spectra; angular distribution function; light scattering properties; mechanical peeling; optical confinement; optical properties; premetal assisted chemical etching; refraction index; silicon nanowire arrays; silicon substrate; solar cells; Optical arrays; Optical device fabrication; Optical imaging; Optical scattering; Photovoltaic cells; Silicon; Mie scattering; angular distribution function; light scatterin generation; silicon nanowire;
Conference_Titel :
Photovoltaic Specialists Conference (PVSC), 2013 IEEE 39th
Conference_Location :
Tampa, FL
DOI :
10.1109/PVSC.2013.6744510
